CIC™ enhances first bond reliability through precise design and superior control. Engineered for fine-pitch applications, it delivers tighter bond consistency, minimizes pad damage, and improves overall process stability, ensuring dependable performance for both gold and copper wire bonding.


Designed for precision and process stability, this solution offers tighter first bond diameter control with higher intermetallic coverage, significantly reducing pad peeling and cratering.



Its optimized tip, hole, and chamfer geometry enhance first bond response, ensuring consistent and reliable bonding performance across applications.

Bond Precision

Design control

CIC™ is purpose-built for fine-pitch applications up to 80 µm BPP, featuring FP and UFP designs with optimized tip, whole, and chamfer geometry. These enhancements deliver sharper first bond responses and ensure compatibility across both gold and copper wire processes.

Reliable Bonding

Damage reduction

CIC™ achieves tighter first bond diameter control with improved intermetallic coverage, minimizing pad peeling and cratering. Its refined engineering enhances first bond reliability and ensures consistent performance in demanding production environments.

Process Adaptability

Application range

Designed to address FP and UFP first bond reliability challenges, CIC™ supports bond pad pitches from 25–80 µm and wire diameters between 0.45–1.3 mil. This provides flexibility for a wide range of packaging needs.

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